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질화규소 세라믹 분말
제품정보
고순도 초미세 세라믹 질화규소 분말
| Silicon nitride powder | |||
| Items | Value | Test method | Standard |
| α/% | ≥93 | X-ray diffraction method | JIS R1640 |
| O/% | ＜1.3 | Infrared absorption method | ASTM C1494 |
| C/% | ＜0.1 | Infrared absorption method | ASTM C1494 |
| Free Si% | ＜0.1 | - | - |
| N/% | ≥38.6 | Infrared absorption method | ASTM C1494 |
| Fe/ppm | ＜300 | Atomic absorption spectroscopy | DB13/T 1232-2010 |
| Al/ppm | ＜150 | Atomic absorption spectroscopy | DB13/T 1232-2010 |
| Ca/ppm | ＜150 | Atomic absorption spectroscopy | DB13/T 1232-2010 |
| Silicon nitride powder(ultra fine) | |||
| Items | Value | Test method | Standard |
| α/% | ≥92 | X-ray diffraction method | JIS R1640 |
| O/% | ＜1.3 | Infrared absorption method | ASTM C1494 |
| C/% | ＜0.1 | Infrared absorption method | ASTM C1494 |
| N/% | ≥38.6 | Infrared absorption method | ASTM C1494 |
| Fe/ppm | ＜400 | Atomic absorption spectroscopy | DB13/T 1232-2010 |
| Al/ppm | ＜200 | Atomic absorption spectroscopy | DB13/T 1232-2010 |
| Ca/ppm | ＜200 | Atomic absorption spectroscopy | DB13/T 1232-2010 |
| Size(μm) | D50<0.5 | Laser particle size analyzer | GB/T 19077.1 |
| D90<1.3 | |||
