Test Grade Wafer
Fuleda Technology supplies Shin-Etsu and SUMCO test-grade semiconductor silicon wafers in original packing.
| Method | CZ |
| Grade | Test Grade |
| Diameter | 200mm±0.3 |
| Type/Dopant | P-Type / Boron(B) |
| Orientation | (100) |
| Resistance | 1~100 ohm-cm |
| Thincness | 725mm±25 |
| TTV | ＜15um |
| BOW | ＜30um |
| Warp | ＜40um |
| Surface | Polished / Etched |
| Particle | ≥0.2um@≤50 |
